GOAL AND AUDIENCE
Exactly 30 years after its first occurence in Paris, the triennal international conference IIB on « Intergranular and Interphase Boundaries in Materials » will take place again in Paris, at the École Nationale Supérieure de Chimie de Paris.
The IIB Conferences represent a unique international forum bringing together the specialists working in different areas of Interface Science. Researchers that otherwise are mainly focused on their scientific domain have a unique opportunity to exchange their views and ideas with colleagues investigating the different aspects of interfacial behavior.
COVERAGE
IIB conferences strongly promote an interdisciplinary approach in the field of grain boundaries and interphase boundaries structure, and properties in a wide range of materials. A variety of hot topics will be covered such as:
- Characterization of interfaces
- Modeling of interfaces
- Thermodynamics and kinetics of interfaces
- Mechanical properties and interfaces
- Interfaces in advanced and emerging materials
- Electronic, magnetic and photonic materials, energy materials, nanomaterials and low-dimensional systems, metals, ceramics, composites, polymer and organic materials, biomaterials
WHERE AND WHEN
IIB 2019 will be a one-session conference based on invited lectures, extended discussion periods, and poster sessions (posters will be exposed during entire duration of the conference).
The program will be revealed after the submission process. The deadline to submit an abstract is 15 January 2019.
Supported by the SF2M (Société Française de Métallurgie et de Matériaux), the 2019 conference will take place from 1 till 5 July 2019 in Paris, at Ecole de Chimie (Chimie ParisTech).
JOURNAL OF MATERIALS SCIENCE
Participants will be invited to submit their contributions as regular manuscripts (no conference proceedings papers, review articles are encouraged) under the category « Special IIB2019 Issue » to Journal of Materials Science (created by Robert W. Cahn in 1966, Editor-in-Chief Barry C. Carter, impact factor 2.993, https://link.springer.com/journal/10853). Guest Editor(s): to be designed soon.
The last three previous JMS IIB Special Issues are:
IIB2016 vol. 52 Issue 8, April 2017
IIB2013 vol. 49 Issue 11, June 2014
IIB2010 vol. 46 Issue 12, June 2011
Don't miss the 2019 edition!
Propose an abstract and join the conference in July 2019, in Paris.
Our invited speakers
Sergiy Divinski
Title of the invited presentation:
« Grain-Boundary Phase Transition probed by Tracer Diffusion Measurements »
Yuri Mishin
Title of the invited presentation:
« Interaction of Moving Grain Boundaries with Solutes »
David Srolovitz
Title of the invited presentation:
« The How and Why of Grain Boundary Dynamics: a Disconnection Perspective »
Chen Li
Title of the invited presentation:
« Grain Boundaries in Solar Cells: Structure-Property Correlations »
Uli Dahmen
Title of the invited presentation:
« Atomic-Scale Observations of Step Structure and Migration Mechanisms in Interfaces »
Sherri Hadian
Title of the invited presentation:
« Atomistic Migration Mechanisms in General Grain Boundaries »
Yuichi Ikuhara
Title of the invited presentation:
« Grain Boundary Atomic Structures and their Dynamic Behavior in Oxides »
Frédéric Mompiou
Title of the invited presentation:
« Using in-situ TEM to probe Interface related Plasticity Mechanisms »
Si-Young Choi
Title of the invited presentation:
« Unveiling metal-insulator transition in vanadium oxides »
Bio:
Dr. Si-Young Choi is an associate professor in department of materials science and engineering at POSTECH. He installed JEOL ARM-200F with ASCOR for laboratory research and established Advanced Electron Microscopy & Functional Imaging Laboratory based on the aberration-corrected STEM. Based on his experience in the relevant fields, he recently established Artificial Intelligence based Materials Analysis Center in POSTECH.
He had got his PhD degree in Korea Advanced Institute of Science and Technology in 2004. Since then, he was a fellow researcher in the field of aberration-corrected scanning transmission electron microscopy in Oxford University and the University of Tokyo. In 2008, he joined Korea Institute of Materials Science (KIMS). He served as Head of Department of Materials Modeling & Characterization and built up the probe-corrected JEOL 2100F, differential phase contrast detector system, and various in-situ observation facilities during his stay in KIMS. In 2017, he moved to department of materials science and engineering at POSTECH.
His main specialty is the atomic scale analysis via aberration-corrected STEM in the variety of functional oxides, such as ferroelectric/piezoelectric perovskite oxides, Li-ion battery cathode oxides, and multiferroic oxides, thereby providing direct evidence of the atomic scale evolution of material property. Therefore, he and his group focus on the application of aberration-corrected STEM with emphasis on the unprecedented atomic scale imaging techniques aimed at unraveling and understanding the various material property-dependent device performance.
IIB 2019 is supported by SF2M
